An automated atomic force microscope (AFM) designed to allow scientists and engineers to effortlessly collect 3D data at the nanoscale has been unveiled by Ontario, Canada-based ICSPI. The Redux AFM is geared to elevate the user experience of nanoscale imaging with automation.

Traditional AFM instruments, while powerful for nanoscale surface imaging, are often hindered by complex and time-consuming setup processes, which are rooted in technology developed in the 1980s. Recognizing this challenge, ICSPI revolutionized the landscape with its unique AFM-on-a-chip technology. The Redux AFM, harnessing this breakthrough technology, makes nanoscale imaging effortless. By integrating multipleSource: ICSPI components onto a single chip, the Redux eliminates the cumbersome aspects of traditional AFM, such as silicon probe exchange, cantilever alignment, tip crashes, tip-sample approach and controller tuning.

The Redux system offers:

1. Automated set-up: one-click motorized and automatic approach
2. No laser alignment: one-click configuration
3. High-throughput: three-minute time-to-data for routine scans
4. Precision sample positioning: motorized XY stage and integrated optical microscope
5. Large sample platform: sample platform that can accommodate 100 mm wafers

David Morris, director of operations at ICSPI, explained: "Legacy AFMs, with their laser-based sensing and finicky silicon probes, are often daunting and time-consuming for users. Our goal with the Redux is to make AFM as fast and intuitive as optical microscopy, enabling scientists and engineers to focus on advancing scientific discovery and technological progress."