Saelig Company, a distributor of test and measurement equipment, has developed the Siglent SDS6000L series low profile 2 GHz/8-Ch digital oscilloscope series, with four or eight analog channels (expandable up to 512 channels) and 16 digital channels (up to 1,024 channels) in a space-saving chassis size that creates a standalone oscilloscope when connected to external displays and a mouse.

There are six models in the series: SDS6208L (2GHz/8-ch), SDS6204L (2GHz/4-ch), SDS6108L (1GHz/8-ch), SDS6104L (1GHz/4-ch), SDS6058L (500MHz/8-ch) and SDS6054L (500MHz/4-ch), all of which offer a maximum sample rate of 5GSa/s (10GSa/s ESR) for each channel, with a maximum record length of 500 Mpts/ch. The instruments' eight-bit resolution extends up to 12-bit in ERES mode, equivalent to 16-bit hi-res mode.

Source: Saelig Company

The series uses the company's advanced SPO technology with a maximum waveform capture rate of up to 170,000 wfm/s (up to 750,000 wfm/s in Sequence Mode). It provides an innovative digital trigger system with high sensitivity and low jitter, which supports many powerful triggering modes, comprising serial bus triggering and decoding (I2C, SPI, UART, LIN, CAN, CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT and Manchester Code.) Tools, including History Waveform Recording, Search and Navigate functions, Power Analysis, Mask Test and Eye/Jitter Analysis, provide for extended waveform records to be captured, stored and analyzed. An excellent array of measurement and math capabilities are matched with options for a 25 MHz arbitrary waveform generator and serial decoding choices in this series of oscilloscopes.

These instruments may be combined with a 64-channel synchronization distributor (SYN64), allowing multiple SDS6000L modules to be organized as a high-speed acquisition system with up to 512 channels. A complete SCPI command set over a standard 1000 M LAN connection offers fast remote control and data acquisition for speed-conscious automated test applications.

These new oscilloscopes are excellent for system-level debug applications requiring deep system visibility or for complex debug situations and data-gathering challenges where channel count matters.