Source: Hitachi High-Tech Analytical ScienceX-ray fluorescence (XRF) coating thickness and materials analyzers perform quality control and validation testing and get the right results in seconds.

Microspot XRF coating thickness and materials analyzers from Hitachi High-Tech Analytical Science provide a widely accepted and industry-proven analytical technique that is easy-to-use, fast and requires little to no sample preparation. They are capable of performing non-destructive analysis of solids or liquids over a wide element range from 13Al to 92U on the periodic table.

The Microspot XRF range includes the MAXXI 6, X-Strata920, FT110A and the FT150.

The MAXXI 6 is ideal for measuring thin coatings and trace-level element composition. It features up to six primary filters and eight collimators and a giant slotted chamber design that is ideal for small, large or long samples. It offers superior resolution and high-efficiency SDD to tackle the most challenging applications, and its optimized hardware configuration allows for direct analysis of %P in electroless nickel applications.

The X-Strata920 can be configured to handle a variety of sample shapes and sizes. Three different stages include a standard base for rapid sample positioning of small or thin parts, a mini-well base with a movable tray to fit small and large parts up to 6 in. and a motorized X-Y stage that allows for automated analysis of multiple samples or multiple locations on a single sample.