Hitachi High-Tech Analytical Science has expanded its coatings and materials analysis range with the launch of the new FT210 X-ray fluorescence (XRF) analyzer. The FT210 includes a proportional counter detector for routine measurements of common platings and incorporates advanced user-friendly features designed to enhance high-volume testing needs.

The launch of the FT210 also includes an updated version of FT Connect software for all FT200 series models,Source: Hitachi High-Tech Analytical Science with enhanced usability features for reporting, creating calibrations and data handling. This new version of FT Connect expands the RoHS screening capabilities of the FT230, and the FT Connect V1.2 software is compatible with both new and existing instruments.

The FT210 offers features to improve productivity by reducing the time needed to set up a measurement and act on data. To accelerate analysis set up, the FT200 series comes with the largest-in-industry sample view, wide view camera, auto-focus and auto approach, and a smart recognition feature called Find My Part, which automatically recognizes features to be measured and chooses the correct analytical method. According to the company, set-up time decreases from 73 seconds to 19 seconds for a 5-point program using Find My Part. This saves 54 seconds per run and 45 minutes daily (with 50 runs).