Emerson has rolled out a radio frequency (RF) four-port vector network analyzer (VNA) designed to expand RF validation capability to multiple-input, multiple-output (MIMO) and multiport S-parameter applications.

Called the NI PXIe-5633, the RF test tool allows engineers to expand validation capacity, address next-generation wireless test challenges, consolidate measurements in a single system and build adaptable test systems via a software-connected platform, Emerson said.

“RF test is no longer only about validating individual components in isolation,” said Kevin Schultz, NI CTO with Emerson’s test and measurement business. “As wireless systems become more distributed, software-defined and antenna-intensive, engineers need test architectures that evolve as quickly as the technologies they are validating.”

The test and measurement tool will help to build adaptable infrastructure for system-level validation and wireless innovation, Schultz added.

The VNA can be used in a range of applications like:

• Semiconductor validation
• Advanced wireless research
• Aerospace and defense systems

Additionally, the tool is applicable to other RF-intensive technologies built around multi-antenna, multichannel and software-defined architectures, Emerson said.

Why multiple RF paths matter

Emerson said extending vector network analysis capabilities to four ports helps engineers characterize complex RF devices.

Because wireless systems increasingly rely on multiple RF paths, synchronized radios and distributed architectures, characterizing RF devices across entire systems rather than individual components has become a must, the company said.

With the NI PXIe-5633, engineers can perform S-parameter characterization as well as modulated RF measurements via a single RF connection. This reduces the need for separate instruments and test setups when using a software-driven PXI system, Emerson added.